10/28/2026
Conventional laser diffraction assumes every particle is a sphere—leaving agglomerates, irregular shapes, and oversized particles completely hidden.
If these blind spots are affecting your formulation or product quality, join our upcoming 45-minute technical session to see how combining Laser Diffraction (LD) and Dynamic Image Analysis (DIA) provides a complete picture of your sample in a single run.
We’ll explore real-world methods for catching critical outliers and capturing true shape metrics using the Microtrac SYNC series.
🎙️ Speaker: Matthew Elmer, Product Specialist – Particle Characterization
🗓️ Date: Tuesday, November 10, 2026
⏰ Time: 10:00 – 10:45 AM EST (45 Min)
👉 Reserve your free spot here: https://www.microtrac.com/news/dates-events/webinar-more-than-particle-size-discover-the-power-of-the-camera/