26/05/2026
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Following our recent attendance at the PIC International Conference in Brussels this April, we wanted to share a reminder of the PIC testing solutions Yelo has to offer.
From accelerated ageing and optical continuity monitoring during stress, to real-time parametric drift detection — our systems keep the live optical path maintained, monitored, and logged throughout the entire test process. Not just before and after.
🔬 Key capabilities include:
On-chip RTD / thermistor readout for embedded thermal monitors
Multi-channel DAQ sampling optical power, wavelength, bias current & voltage
Real-time alarm thresholds for early failure detection
Continuous logging via DSP & Control Unit with Photodetector Array
If you'd like to find out more about our PIC reliability testing services, get in touch with the sales team:
📞 +44 (0) 28 9335 7300
📧 [email protected]
🌐 www.yelo.co.uk