NaMLab

22/10/2026

Electrostatics of Common-Channel Reconfigurable Field-Effect Transistors: From X-Shape to U-Shape

https://onlinelibrary.wiley.com/doi/10.1002/pssa.70567

15/10/2026

Re-Thinking Electronic Circuit Design Through Emerging Reconfigurable Field Effect Transistors

https://advanced.onlinelibrary.wiley.com/doi/10.1002/advs.78121

03/09/2026

https://oiger.de/2026/09/03/chip-innovationen-aus-sachsen-sollen-kis-auf-trab-bringen/198399

20 Jahre Namlab: Ferroelektrische Speicher, KI-Chips, die sich selbst neu morphen und andere Innovationen aus Dresden die Mikroelektronik umkrempeln

11/08/2026

Ferroelectric Polarization Enabled Threshold Voltage Modulation in High Electron Mobility Transistor

https://advanced.onlinelibrary.wiley.com/doi/10.1002/adfm.77470?utm_source=researchgate.net&utm_medium=article

17/07/2026

Millisecond-Scale Relaxation in Metastable HZO Ferroelectric Capacitors for Bio-Inspired Temporal Computing

https://advanced.onlinelibrary.wiley.com/doi/10.1002/aelm.202500794

19/06/2026

Congrats to Eric Fehrmann for winning the 2. Prize in the 2026 Emerging Talent Award of the "Friends of IHP" association!

19/06/2026

Insights into the Application of NDR Nanodevices for Signal Amplification

https://www.taylorfrancis.com/chapters/edit/10.1201/9788743812791-13/insights-application-ndr-nanodevices-signal-amplification-alon-ascoli-gemo-rossetti-corinto-bonnin-gilli-civalleri-demirkol-messaris-prousalis-ntinas-slesazeck-mikolajick-tetzlaff-chua?context=ubx&refId=b8eda421-c60c-46d8-b335-9edbaa16110e

19/06/2026

Three-Independent-Gate Reconfigurable Transistors in 22 nm FDSOI for in-Sensor Time-Domain Mixed-Signal Processing

https://ieeexplore.ieee.org/document/11562063

19/06/2026

A Low-Power 2-bit Full Adder realized with Three-Independent-Gate Reconfigurable FETs

https://ieeexplore.ieee.org/document/11562307

08/06/2026

Impact of field stress pattern on the performance of HfO2-based ferroelectric tunnel junctions

https://pubs.aip.org/aip/jap/article/139/22/224101/3394040/Impact-of-field-stress-pattern-on-the-performance