J.A. Woollam

04/09/2026

We’re excited to share our latest publication in Journal of Applied Physics:

“Fast Mueller matrix infrared ellipsometry using quantum cascade laser: Applications in material characterization”

This work presents a high-speed infrared spectroscopic ellipsometer using a tunable quantum cascade laser (QCL), enabling rapid acquisition of Mueller matrix data with applications in material characterization and real-time process monitoring.

The study demonstrates:
• Measurement of complex molecular vibrations in polymers
• Characterization of anisotropic materials such as LiNbO₃
• Temperature-dependent analysis of phonon behavior
• Real-time monitoring of thin film growth (SiO₂ on Si)

By leveraging the high brightness of QCL sources, this approach significantly improves acquisition speed compared to conventional FTIR ellipsometry, opening new opportunities for in situ and in-line measurements.

📄 Read the full publication:

https://pubs.aip.org/aip/jap/article/139/13/134501/3386414/Fast-Mueller-matrix-infrared-ellipsometry-using

We present a high-speed infrared spectroscopic ellipsometer using a tunable quantum cascade laser (QCL), leveraging its high brightness for potential in situ an

03/24/2026

Atlanta is hosting a celebration of chemistry 🎉

J.A. Woollam Co. is at ACS Spring 2026 at the Georgia World Congress Center in Atlanta, GA, marking 150 years of the American Chemical Society (ACS) under the theme “Collaborate, Innovate, and Transform.” This global event brings together researchers, educators, and industry leaders to share the latest advancements in chemistry.

From materials science to surface analysis, the conference highlights innovations shaping research and technology—and the role of polarized light continues to be central in understanding material properties.

Stop by Booth 1108 to connect with our team and explore ellipsometry.

📍 Exhibit Hours
• Monday & Tuesday: 11:00 AM – 5:00 PM
• Wednesday: 10:00 AM – 2:00 PM

Come meet Ron Synowicki and Matt Winburn at the booth.

03/20/2026

WizOptics hosted a two-day CompleteEASE seminar in Suwon (near Seoul), Korea at the Advanced Institute of Convergence Technology on March 18–19. Our J.A. Woollam Co. instructor, Nina Hong, PhD. was excited for such a fantastic turnout and expressed the enthusiasm from attendees throughout the event.

Thank you to everyone who joined us and helped make the seminar such a success.

03/05/2026

📢 New research publication

A new article has been published in SPIE’s Journal of Astronomical Telescopes, Instruments, and Systems (JATIS).

The paper investigates the polarization properties of Xe-LiF coated aluminum mirror samples, which are widely used in ultraviolet telescope optics. Understanding the polarization response of these coatings is important for optical modeling, calibration, and instrument design in UV astronomy.

📖 Access the paper:
https://doi.org/10.1117/1.JATIS.12.4.041004

Citation:
Skousen, N. B., Loewecke, S. E., Rydalch, T. D., Hilfiker, J. N., Rodriguez de Marcos, L. V., Quijada, M. A., del Hoyo, J. G., & Allred, D. D., Polarization properties of Xe-LiF coated aluminum mirror samples, JATIS 12(4), 041004 (2026).

02/27/2026

The SPIE Advanced Lithography conference took place Tuesday and Wednesday, bringing together people, researchers and engineers focused on optical and EUV lithography, materials, metrology, and process integration.

Many discussions focused on the challenges of advanced device fabrication; including photoresist characterization, multi-layer film stacks, process control strategies, and materials development for next-generation nodes.

As semiconductor architectures continue to increase in complexity, accurate thin film metrology remains foundational to process understanding and yield improvement.

Thank you to SPIE and to everyone who contributed to the technical sessions and discussions this week.

02/24/2026

The J.A. Woollam Company is pleased to share that the 1st American Workshop on Ellipsometry (AWE-1) will be held February 28 – March 3, 2027, in Lincoln, Nebraska.

Hosted on the Nebraska Innovation Campus, AWE-1 will mark the inaugural workshop and exhibition organized by the North American Ellipsometry Association (NAEA). The meeting aims to bring together experienced leaders, early-career professionals, and students from academia, public institutions, and industry to exchange scientific and technological knowledge in ellipsometry and related techniques.

Distinguished tutorial and invited speakers are anticipated to cover both fundamentals and specialized applications. A Call for Abstracts and exhibitor information will be released soon. International participants are welcome and encouraged.

We look forward to welcoming colleagues from across North America and beyond to Lincoln in early 2027.

For updates and event details, visit: https://awe1.ellipsometry.us/

02/20/2026

J.A. Woollam Co. is excited to highlight the call for abstracts for the AVS 72nd International Symposium & Exhibition—the premier forum for materials, surfaces, interfaces, and devices science and technology!

📅 Abstract Deadline: May 18, 2026 — don’t miss your chance to present your work!
📍 Conference Dates & Location: November 8–13, 2026 at the David L. Lawrence Convention Center, Pittsburgh, PA 🇺🇸.

The AVS Symposium brings together researchers from academia, industry, and national labs to share cutting-edge research in vacuum science, thin films, nanotechnology, surface and interface science, photonics, quantum science, and much more.

✨ Spectroscopic Ellipsometry Technical Group — We’re looking for abstracts in areas that showcase the breadth and innovation of ellipsometry research.

👩‍🔬👨‍🔬 Whether you’re exploring thin films, complex materials, advanced analytical methods, or new ellipsometric instrumentation, we’d love to see your work featured in the ellipsometry sessions!

Submit your abstract by May 18 and join the international scientific community in Pittsburgh this November! 🚀

02/05/2026

QUESTION:
What happens when you put
📐 ellipsometry fundamentals,
🧠 real-world data analysis, and
✏️ a room full of thoughtful questions
on one campus for three days?

ANSWER:
You get a hands-on spectroscopic ellipsometry short course at the University of Central Florida, led by the J.A. Woollam Co. Applications Engineering team.

From transparent films and Cauchy models to absorbing layers, oscillator theory, B-splines, and combined SE + transmission fitting, the course followed the natural progression of how measurements actually evolve in the lab—messy data, smarter models, and better decisions.

Thanks to UCF for hosting and to everyone who joined the discussion in Orlando. Three focused days, strong questions, and a shared goal of doing ellipsometry well.

01/27/2026

Light waves. Sound waves. Same conference, different stage. 🎸✨

Last week at SPIE Optics + Photonics, the J.A. Woollam Co. team spent the days talking ellipsometry, optical constants, and precision measurement — and one of the nights celebrating the science in a different way.

Ron Synowicki took part in SPIE JAMS, bringing the groove on his Rickenbacker 4003S.

Whether it’s photons or sound waves, it’s all about frequency, phase, and amplitude — and how waves interact with the world around us.

Thanks to SPIE for another great Optics + Photonics meeting and a fun way to bring the community together.

01/21/2026

Networking isn’t just exchanging business cards.

It’s reconnecting with longtime colleagues, strengthening the relationships that have shaped your work, and meeting new acquaintances who might become your next collaborator, customer, or friend.

As Helen Keller said:
“Alone we can do so little; together we can do so much.”

There’s something about being at a conference like SPIE that can’t be replicated through email threads or virtual meetings.

Innovation moves forward when the right people end up in the same place — comparing notes in a hallway, sketching ideas on a napkin, or catching up between sessions and discovering you’re working on the same problem from two different angles.

We’re grateful for every conversation that helps move research forward — one handshake, one question, and one new idea at a time.

01/21/2026

📍 San Francisco | Moscone Center | SPIE Photonics West Week

This week, the Moscone Center becomes a living snapshot of the optics + photonics world — where new light sources, new materials, and new device architectures all converge in one place.

J.A. Woollam Co. is here all week at SPIE Photonics West — and we’re also excited to be part of the momentum happening at SPIE AR | VR | MR, where the future of immersive optical systems is taking shape in real time.

Find us at:
🔹 SPIE AR | VR | MR Expo — Booth #6600
🔹 SPIE Photonics West Exhibition — Booth #3561

And if you caught us earlier this weekend — BiOS is already in the books, and it was a strong start to an exciting week of science and conversation.

We look forward to continued discussions on thin-film characterization, optical constants (n, k), multilayer structures, and ellipsometric metrology for advanced photonics and display technologies.

👉 Stop by to connect with our team and discuss measurement challenges and applications.

01/13/2026

🚨 Reminder: Registration Closes Soon! 🚨

Don’t miss your chance to join the J.A. Woollam Co. CompleteEASE Short Course at the University of Central Florida(UCF) in Orlando, FL that will take place Monday-Wednesday, February 2-4, 2026!

If you’ve been meaning to register, now is the time — spots are limited and registration ends January 23rd.

✅ Learn practical ellipsometry fundamentals
✅ Build confidence in CompleteEASE® data analysis
✅ Get expert instruction + real-world insight

📍 University of Central Florida (UCF)

📝 Register here: https://www.jawoollam.com/resources/short-courses/2026-ucf-winter-completeease-short-course

DoubleTree by Hilton Hotel Orlando East-UCF Area 12125 High Tech Ave, Orlando, FL 32817 1-407-275-9000 Distance: 0.3 mile