21/10/2026
💡 Case Study | Powering SiC Burn-in Testing: 2400V High-Voltage & 10mA Micro-Current
We recently partnered with a client in the semiconductor industry to solve a challenging testing requirement for SiC (Silicon Carbide) chips. Sharing a quick look at our solution and the selection logic behind it:
🔍 The Challenge:
The client needed to conduct static burn-in (HTOL) for SiC chips inside a 125°C oven. The testing profile was extreme: requiring a bias voltage of 600–2400V with an operating current of only 10mA. This high-voltage, low-current scenario demanded exceptional precision, stability, and safety from the power supply.
🛠️ The VARIED Solution:
We recommended the RU-D-20001 / RU-D-30001 programmable power supplies, configured in a "1-to-1" architecture (1 power supply driving 1 burn-in board).
Precise HV Regulation: Seamlessly covers 600–2400V for extreme bias conditions.
Stable Micro-Current: Zero drift, high stability, and low ripple at a 10mA operating current.
Endurance & Protection: Supports 7×24h continuous operation for hundreds of hours, with fast latch-off OVP, OCP, and arc protection to prevent mass chip burnout.
✨ Why the "1-to-1" Architecture?
In semiconductor burn-in lines, independent control is key. A single power supply driving one board ensures fault isolation—if one board fails, it won't affect the rest of the batch. This makes isolating failed components easy and enables reliable unattended monitoring.
Looking for a reliable power solution for your high-voltage or long-cycle testing applications? Let's connect! 👇